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A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping

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A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping. / Whitley, William; Stock, Chris; Huxley, Andrew D.

In: Journal of Applied Crystallography, Vol. 48, 08.2015, p. 1342-1345.

Research output: Contribution to journalArticlepeer-review

Harvard

Whitley, W, Stock, C & Huxley, AD 2015, 'A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping', Journal of Applied Crystallography, vol. 48, pp. 1342-1345. https://doi.org/10.1107/S1600576715009097

APA

Whitley, W., Stock, C., & Huxley, A. D. (2015). A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping. Journal of Applied Crystallography, 48, 1342-1345. https://doi.org/10.1107/S1600576715009097

Vancouver

Whitley W, Stock C, Huxley AD. A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping. Journal of Applied Crystallography. 2015 Aug;48:1342-1345. https://doi.org/10.1107/S1600576715009097

Author

Whitley, William ; Stock, Chris ; Huxley, Andrew D. / A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping. In: Journal of Applied Crystallography. 2015 ; Vol. 48. pp. 1342-1345.

Bibtex - Download

@article{96203a9d0a8449788e7c6f9ca5b06e45,
title = "A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping",
abstract = "Although CCD X-ray detectors can be faster to use, their large-area versions can be much more expensive than similarly sized photographic plate detectors. When indexing X-ray diffraction patterns, large-area detectors can prove very advantageous as they provide more spots, which makes fitting an orientation easier. On the other hand, when looking for single crystals in a polycrystalline sample, the speed of CCD detectors is more useful. A new setup is described here which overcomes some of the limitations of limited-range CCD detectors to make them more useful for indexing, whilst at the same time making it much quicker to find single crystals within a larger polycrystalline structure. This was done by combining a CCD detector with a six-axis goniometer, allowing the compilation of images from different angles into a wide-angled image. Automated scans along the sample were coupled with image processing techniques to produce grain maps, which can then be used to provide a strategy to extract single crystals from a polycrystal.",
keywords = "laboratory-based Laue X-ray diffraction, Grain mapping",
author = "William Whitley and Chris Stock and Huxley, {Andrew D.}",
year = "2015",
month = aug,
doi = "10.1107/S1600576715009097",
language = "English",
volume = "48",
pages = "1342--1345",
journal = "Journal of Applied Crystallography",
issn = "0021-8898",
publisher = "INT UNION CRYSTALLOGRAPHY",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping

AU - Whitley, William

AU - Stock, Chris

AU - Huxley, Andrew D.

PY - 2015/8

Y1 - 2015/8

N2 - Although CCD X-ray detectors can be faster to use, their large-area versions can be much more expensive than similarly sized photographic plate detectors. When indexing X-ray diffraction patterns, large-area detectors can prove very advantageous as they provide more spots, which makes fitting an orientation easier. On the other hand, when looking for single crystals in a polycrystalline sample, the speed of CCD detectors is more useful. A new setup is described here which overcomes some of the limitations of limited-range CCD detectors to make them more useful for indexing, whilst at the same time making it much quicker to find single crystals within a larger polycrystalline structure. This was done by combining a CCD detector with a six-axis goniometer, allowing the compilation of images from different angles into a wide-angled image. Automated scans along the sample were coupled with image processing techniques to produce grain maps, which can then be used to provide a strategy to extract single crystals from a polycrystal.

AB - Although CCD X-ray detectors can be faster to use, their large-area versions can be much more expensive than similarly sized photographic plate detectors. When indexing X-ray diffraction patterns, large-area detectors can prove very advantageous as they provide more spots, which makes fitting an orientation easier. On the other hand, when looking for single crystals in a polycrystalline sample, the speed of CCD detectors is more useful. A new setup is described here which overcomes some of the limitations of limited-range CCD detectors to make them more useful for indexing, whilst at the same time making it much quicker to find single crystals within a larger polycrystalline structure. This was done by combining a CCD detector with a six-axis goniometer, allowing the compilation of images from different angles into a wide-angled image. Automated scans along the sample were coupled with image processing techniques to produce grain maps, which can then be used to provide a strategy to extract single crystals from a polycrystal.

KW - laboratory-based Laue X-ray diffraction

KW - Grain mapping

U2 - 10.1107/S1600576715009097

DO - 10.1107/S1600576715009097

M3 - Article

VL - 48

SP - 1342

EP - 1345

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

ER -

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