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Research at St Andrews

A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping

Research output: Contribution to journalArticlepeer-review

Related by journal

  1. Neutron scattering length determination by means of total scattering

    Hannon, A. C., Gibbs, A. S. & Takagi, H., Jun 2018, In: Journal of Applied Crystallography. 51, Part 3, p. 854-866 13 p.

    Research output: Contribution to journalArticlepeer-review

  2. Size and shape of graphene layers in commercial carbon blacks established by Debye refinement

    Andreev, Y. G. & Bruce, P., Feb 2016, In: Journal of Applied Crystallography. 49, 1, p. 24-30

    Research output: Contribution to journalArticlepeer-review

  3. Inferential statistics of electron backscatter diffraction data from within individual crystalline grains

    Jupp, P. E., Florian, B., Hielscher, R., Pantleon, W., Schaeben, H. & Wegert, E., 2010, In: Journal of Applied Crystallography. 43, p. 1338-1355 18 p.

    Research output: Contribution to journalArticlepeer-review

  4. A prototype environmental gas cell for in situ small-molecule X-ray diffraction

    Warren, J. E., Pritchard, R. G., Abram, D., Davies, H. M., Savarese, T. L., Cash, R. J., Raithby, P. R., Morris, R., Jones, R. H. & Teat, S. J., Jun 2009, In: Journal of Applied Crystallography. 42, p. 457-460 4 p.

    Research output: Contribution to journalArticlepeer-review

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