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Characterization of diffuse scattering in yttria-stabilized zirconia by electron diffraction and high-resolution transmission electron microscopy

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Author(s)

S Garcia-Martin, DP Fagg, John Thomas Sirr Irvine

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Abstract

Different phases from the ZrO2-Y2O3 system corresponding to 8, 10, 14, 21, 32, and 37 mol % Y2O3, prepared by quenching from high temperature, have been studied by selected area electron diffraction (SAED) and high-resolution electron microscopy (HRTEM). The results of the 8 and 10 mol% Y2O3 are consistent with a crystal microstructure of three kind of domains of the t or t' phase with the c axes oriented along three mutually perpendicular directions and small displacements of the cations (Zr and Y) from their ideal crystallographic positions. The materials with higher dopant concentration show a modulated fluorite-type structure due to partial or short-range ordering of the oxygen vacancies related to a pyrochlore-type and/or C-type crystal structures.

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Original languageEnglish
Pages (from-to)5933-5938
Number of pages6
JournalChemistry of Materials
Volume20
Issue number18
DOIs
Publication statusPublished - 23 Sep 2008

    Research areas

  • 0-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-1 SYSTEM, IONIC-CONDUCTIVITY, ZRO2-Y2O3 SYSTEM, DEFECT STRUCTURE, MICROSTRUCTURE, TRANSITION, ZRO2, CERAMICS, ALLOYS, PHASE

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