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Measuring the silion fluoride bond distance in zeolites

Research output: Book/ReportBook

Author(s)

R J Darton, D H Brouwer, C A Fyfe, L A Villaescusa, R E Morris

School/Research organisations

Abstract

A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction.

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Details

Original languageEnglish
PublisherUnknown Publisher
Number of pages5
Publication statusPublished - 2004

    Research areas

  • SOLID-STATE NMR, 5-COORDINATE SILICON, MOLECULAR-SIEVES, MEDIA, TEMPLATE, LOCATION, COMPLEX, IONS, IFR, STF

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ID: 706131

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