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Mueller matrix error correction for a fringe-free interferometry system

Research output: Contribution to journalArticle

Author(s)

M L Begbie, W Sibbett, M J Padgett

School/Research organisations

Abstract

We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time. (C) 2001 Optical Society of America.

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Original languageEnglish
Pages (from-to)3205-3210
Number of pages6
JournalApplied Optics
Volume40
Publication statusPublished - 1 Jul 2001

    Research areas

  • SURFACE

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